MEASUREMENT OF EVAPORATION COEFFICIENT BY ELECTRON MICROSCOPY

Simple item page
dc.contributor.authorYACAMAN, MJ
dc.contributor.authorOCANAZ, T
dc.date.accessioned2026-05-28T16:54:24Z
dc.date.issued1978
dc.description.paginacion745 - 748
dc.description.procedenciaEXT
dc.format.discursoCarta
dc.format.extent4
dc.identifier.issn0039-6028
dc.identifier.urihttps://ahcm.cinvestav.mx/handle/ahcm/29674
dc.language.isoInglés
dc.numero.secuencia29671
dc.publisherUNIV NACL AUTONOMA MEXICO,INST FIS,MEXICO CITY 20,MEXICO
dc.relation.ispartofseriesVol. 69 No. 2
dc.source.revistafuenteSURFACE SCIENCE
dc.subjectMEASUREMENT, EVAPORATION COEFFICIENT, ELECTRON-MICROSCOPY
dc.subject.categoriaprincipalFISICA
dc.subject.disciplinaELECTRONICA
dc.subject.subdisciplinaMICROSCOPIA ELECTRONICA
dc.titleMEASUREMENT OF EVAPORATION COEFFICIENT BY ELECTRON MICROSCOPY
dc.title.alternativeSURFACE SCI

Files

Collections

Registros completos